Semiconductor Detector and Its Applications to the X-ray Diffraction Method
نویسندگان
چکیده
منابع مشابه
Application of X-ray Diffraction Techniques to the Semiconductor Field
generally arranged at a distance of 0.1 nm to 0.5 nm from one another. When such a substance is irradiated with X-rays having a wavelength roughly equivalent to the interatomic or intermolecular distance, the Xray diffraction phenomenon will take place. X-ray diffraction is widely used in the semiconductor field because it is nondestructive and yields crystal structure information relatively ea...
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A pure Silicate host namely Sr2MgSi2O7 as a support for a long-lasting afterglow when dopped with rare-earth elements was sought after. To this end the process of obtaining firing temperatures of the above mentioned phase in normal condition was carried out using suggested wet and dry methods. The degree of purity obtained in these preparatory methods as wel...
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ژورنال
عنوان ژورنال: Journal of the Mineralogical Society of Japan
سال: 1974
ISSN: 1883-7018,0454-1146
DOI: 10.2465/gkk1952.11.411